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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Luke Blair

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In the rapidly evolving field of nano-scaled technologies, the design and testing of CMOS SRAM circuits have become increasingly critical. This comprehensive book offers a comprehensive overview of the latest advances in this vital area, providing readers with the knowledge and skills they need to design, analyze, and test SRAM circuits effectively.

Understanding the Basics of CMOS SRAM Circuits

To fully grasp the challenges and complexities of SRAM circuit design, readers must first understand the fundamental principles and operating mechanisms of these circuits. This book begins with a thorough to the basics of CMOS SRAM circuits, covering topics such as:

CMOS SRAM Circuit Design and Parametric Test in Nano Scaled Technologies: Process Aware SRAM Design and Test (Frontiers in Electronic Testing 40)

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing Book 40)

5 out of 5

Language	:	English
File size	:	4339 KB
Text-to-Speech	:	Enabled
Print length	:	212 pages

SRAM cell architecture and operation
Static noise margin (SNM)
Read and write operations
Power consumption and leakage

Advanced Design Techniques for Nano-Scaled Technologies

As technology nodes continue to shrink, conventional SRAM circuit design techniques become less effective. This book explores advanced design techniques that are essential for SRAM circuit design in nano-scaled technologies, including:

FinFET and GAAFET devices
High-κ metal gate (HKMG) dielectrics
Body biasing techniques
Gate splitting and leakage reduction mechanisms

Comprehensive Coverage of Parametric Testing

Parametric testing is crucial for ensuring the reliability and performance of SRAM circuits. This book provides in-depth coverage of parametric testing techniques, including:

Static and dynamic tests
Voltage and temperature stress tests
Process variation and aging effects
Fault modeling and diagnosis

Hands-On Applications and Case Studies

To solidify readers' understanding, this book includes numerous hands-on applications and case studies that illustrate the practical implementation of SRAM circuit design and parametric testing techniques. These examples cover a wide range of applications, including:

Low-power SRAM design for mobile devices
High-performance SRAM design for data centers
Automotive and aerospace SRAM design

Key Features and Benefits

Comprehensive coverage of SRAM circuit design and parametric testing in nano-scaled technologies
Written by leading experts in the field
In-depth analysis of advanced design techniques and test methodologies
Hands-on applications and case studies for practical implementation
Up-to-date information on the latest industry trends and developments

Target Audience

This book is an essential resource for:

Circuit designers working in the field of nano-scaled technologies
Test engineers responsible for SRAM testing
Graduate students and researchers studying CMOS SRAM design and testing
Anyone seeking a comprehensive understanding of the latest advances in SRAM circuit technology

About the Authors

The authors of this book are renowned experts in the field of CMOS SRAM circuit design and parametric testing. They have extensive experience in industry and academia, and have made significant contributions to the advancement of SRAM technology. Their expertise ensures that readers receive the most up-to-date and authoritative information available.

Free Download Your Copy Today

If you are involved in the design, testing, or research of CMOS SRAM circuits in nano-scaled technologies, this book is an invaluable resource. Free Download your copy today and gain a comprehensive understanding of the latest advances in this critical area.

Table of Contents

to CMOS SRAM Circuits 2. SRAM Cell Architecture and Operation 3. Static Noise Margin (SNM) 4. Read and Write Operations 5. Power Consumption and Leakage 6. Advanced Design Techniques for Nano-Scaled Technologies 7. FinFET and GAAFET Devices 8. High-κ Metal Gate (HKMG) Dielectrics 9. Body Biasing Techniques 10. Gate Splitting and Leakage Reduction Mechanisms 11. Comprehensive Coverage of Parametric Testing 12. Static and Dynamic Tests 13. Voltage and Temperature Stress Tests 14. Process Variation and Aging Effects 15. Fault Modeling and Diagnosis 16. Hands-On Applications and Case Studies 17. Low-Power SRAM Design for Mobile Devices 18. High-Performance SRAM Design for Data Centers 19. Automotive and Aerospace SRAM Design 20. and Future Trends 21. References 22. Index

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing Book 40)

5 out of 5