Member-only story

Basics and Use for Evaluating Electronic Devices and Materials: A Comprehensive Guide

Dominic Simmons

·8.4k Followers· Follow

Published in Lock In Thermography: Basics And Use For Evaluating Electronic Devices And Materials (Springer In Advanced Microelectronics 10)

5 min read · 1 month before

343 View Claps

38 Respond

Save

Listen

In the rapidly evolving era of electronics, the evaluation of electronic devices and materials has become paramount. Advanced electronic devices and materials underpin the development of cutting-edge technologies, from smartphones and electric vehicles to medical devices and renewable energy systems. Understanding the principles and techniques involved in evaluating these components is essential for researchers, engineers, and technicians in the field of electronics.

Lock in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer in Advanced Microelectronics 10)

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics Book 10)

4 out of 5

Language	:	English
File size	:	74429 KB
Text-to-Speech	:	Enabled
Screen Reader	:	Supported
Enhanced typesetting	:	Enabled
Word Wise	:	Enabled
Print length	:	645 pages

This comprehensive guide, "Basics and Use for Evaluating Electronic Devices and Materials," provides a thorough foundation in the theory and practice of electronic device and material evaluation. It covers the fundamental concepts, advanced characterization techniques, and practical applications, empowering readers to perform rigorous evaluations and gain valuable insights into the performance and reliability of electronic devices and materials.

Chapter 1: Basic Concepts and Principles

This chapter introduces the fundamental concepts of electronic device and material evaluation. It begins with an overview of the different types of electronic devices and materials, their properties, and their applications. The chapter then delves into the basic principles of electrical, optical, thermal, and mechanical characterization techniques, providing a solid foundation for the subsequent chapters.

Schematic Diagram Of An Electronic Device Evaluation Setup Lock In Thermography: Basics And Use For Evaluating Electronic Devices And Materials (Springer In Advanced Microelectronics 10)

Chapter 2: Electrical Characterization Techniques

Chapter 2 covers the electrical characterization techniques used to evaluate the electrical properties of electronic devices and materials. These techniques include:

* I-V (current-voltage) measurements * C-V (capacitance-voltage) measurements * Impedance spectroscopy * Hall effect measurements * Noise measurements

The chapter provides detailed explanations of the principles, instrumentation, and applications of each technique, enabling readers to select the most appropriate technique for their specific evaluation needs.

Graph Showing Current Voltage Characteristics Of A Semiconductor Device Lock In Thermography: Basics And Use For Evaluating Electronic Devices And Materials (Springer In Advanced Microelectronics 10)

Chapter 3: Optical Characterization Techniques

Optical characterization techniques are used to evaluate the optical properties of electronic devices and materials. Chapter 3 covers the following techniques:

* Photoluminescence (PL) spectroscopy * Raman spectroscopy * Ellipsometry * UV-Vis spectroscopy * FTIR spectroscopy

These techniques provide valuable insights into the band structure, electronic transitions, and surface properties of materials. The chapter discusses the principles, instrumentation, and applications of each technique, enabling readers to gain a comprehensive understanding of their optical characterization capabilities.

Image Of A Raman Spectroscopy Setup Lock In Thermography: Basics And Use For Evaluating Electronic Devices And Materials (Springer In Advanced Microelectronics 10)

Chapter 4: Thermal Characterization Techniques

Thermal characterization techniques are used to evaluate the thermal properties of electronic devices and materials. Chapter 4 covers the following techniques:

* Differential scanning calorimetry (DSC) * Thermogravimetric analysis (TGA) * Thermal conductivity measurements * Heat capacity measurements * Thermal imaging

These techniques provide information about the thermal stability, melting point, thermal conductivity, and heat capacity of materials. The chapter explains the principles, instrumentation, and applications of each technique, enabling readers to select the most appropriate technique for their specific evaluation needs.

DSC Curve Of A Polymer Material Lock In Thermography: Basics And Use For Evaluating Electronic Devices And Materials (Springer In Advanced Microelectronics 10)

Chapter 5: Mechanical Characterization Techniques

Mechanical characterization techniques are used to evaluate the mechanical properties of electronic devices and materials. Chapter 5 covers the following techniques:

* Tensile testing * Compression testing * Hardness testing * Fracture toughness testing * Fatigue testing

These techniques provide information about the strength, ductility, hardness, and fracture resistance of materials. The chapter discusses the principles, instrumentation, and applications of each technique, enabling readers to gain a comprehensive understanding of their mechanical characterization capabilities.

Tensile Testing Of A Metal Wire Lock In Thermography: Basics And Use For Evaluating Electronic Devices And Materials (Springer In Advanced Microelectronics 10)

Chapter 6: Device Modeling and Simulation

Chapter 6 introduces the concepts of device modeling and simulation. It discusses the different types of device models, including analytical models, numerical models, and empirical models. The chapter also covers the simulation techniques used to analyze the performance of electronic devices, including device simulation, circuit simulation, and system simulation.

Schematic Diagram Of A Device Simulation Model Lock In Thermography: Basics And Use For Evaluating Electronic Devices And Materials (Springer In Advanced Microelectronics 10)

Chapter 7: Case Studies

Chapter 7 presents case studies that demonstrate the practical applications of electronic device and material evaluation techniques. These case studies cover a wide range of applications, including:

* Semiconductor device characterization * LED characterization * Solar cell characterization * Battery characterization * MEMS characterization

The case studies provide valuable insights into how the evaluation techniques discussed in the previous chapters can be used to solve real-world problems.

Image Of A Solar Cell Being Evaluated Lock In Thermography: Basics And Use For Evaluating Electronic Devices And Materials (Springer In Advanced Microelectronics 10)

"Basics and Use for Evaluating Electronic Devices and Materials" is an indispensable guide for researchers, engineers, and technicians in the field of electronics. It provides a comprehensive overview of the theory and practice of electronic device and material evaluation, empowering readers to perform rigorous evaluations and gain valuable insights into the performance and reliability of electronic devices and materials.

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics Book 10)

4 out of 5